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	<title>Dimensional archivos - CEISLAB</title>
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	<description>Evaluación de la conformidad y realización de ensayos relacionados con la calidad.</description>
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	<title>Dimensional archivos - CEISLAB</title>
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		<title>Measurement of overall dimensions: UNE-EN 60811-203</title>
		<link>https://www.ceislab.com/en/ensayos/measurement-of-overall-dimensions-une-en-60811-203/</link>
		
		<dc:creator><![CDATA[ceis]]></dc:creator>
		<pubDate>Thu, 18 Nov 2021 09:42:58 +0000</pubDate>
				<guid isPermaLink="false">/?post_type=ensayos&#038;p=4099</guid>

					<description><![CDATA[<p>Test methods Determining the overall measurements of cables depends on the type and size of the sample. These measurements may be made by means of an optical comparator, micrometer or measuring tape.</p>
<p>La entrada <a href="https://www.ceislab.com/en/ensayos/measurement-of-overall-dimensions-une-en-60811-203/">Measurement of overall dimensions: UNE-EN 60811-203</a> se publicó primero en <a href="https://www.ceislab.com/en">CEISLAB</a>.</p>
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<p class="wp-block-paragraph"><strong>Test methods</strong><strong></strong></p>



<p class="wp-block-paragraph">Determining the overall measurements of cables depends on the type and size of the sample. These measurements may be made by means of an optical comparator, micrometer or measuring tape.</p>
<p>La entrada <a href="https://www.ceislab.com/en/ensayos/measurement-of-overall-dimensions-une-en-60811-203/">Measurement of overall dimensions: UNE-EN 60811-203</a> se publicó primero en <a href="https://www.ceislab.com/en">CEISLAB</a>.</p>
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		<title>Measurement of Insulation thickness: UNE-EN 60811-201</title>
		<link>https://www.ceislab.com/en/ensayos/measurement-of-insulation-thickness-une-en-60811-201/</link>
		
		<dc:creator><![CDATA[ceis]]></dc:creator>
		<pubDate>Thu, 18 Nov 2021 09:41:23 +0000</pubDate>
				<guid isPermaLink="false">/?post_type=ensayos&#038;p=4097</guid>

					<description><![CDATA[<p>Test methods Determination of the insulation thickness can be performed under a microscope, an optical comparator or a digital optical analyser. The insulating material must be separated from the rest of the materials that are not adhered to it, without damaging it and producing a thin strip perpendicular to the conductor axis. Measurements are made [&#8230;]</p>
<p>La entrada <a href="https://www.ceislab.com/en/ensayos/measurement-of-insulation-thickness-une-en-60811-201/">Measurement of Insulation thickness: UNE-EN 60811-201</a> se publicó primero en <a href="https://www.ceislab.com/en">CEISLAB</a>.</p>
]]></description>
										<content:encoded><![CDATA[
<p class="wp-block-paragraph"><strong>Test methods</strong><strong></strong></p>



<p class="wp-block-paragraph">Determination of the insulation thickness can be performed under a microscope, an optical comparator or a digital optical analyser.</p>



<p class="wp-block-paragraph">The insulating material must be separated from the rest of the materials that are not adhered to it, without damaging it and producing a thin strip perpendicular to the conductor axis.</p>



<p class="wp-block-paragraph">Measurements are made radially and distributed regularly along the surface of the sample.</p>
<p>La entrada <a href="https://www.ceislab.com/en/ensayos/measurement-of-insulation-thickness-une-en-60811-201/">Measurement of Insulation thickness: UNE-EN 60811-201</a> se publicó primero en <a href="https://www.ceislab.com/en">CEISLAB</a>.</p>
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		<title>Measurement of thickness of non-metallic sheath: UNE-EN 60811-202</title>
		<link>https://www.ceislab.com/en/ensayos/measurement-of-thickness-of-non-metallic-sheath-une-en-60811-202/</link>
		
		<dc:creator><![CDATA[ceis]]></dc:creator>
		<pubDate>Thu, 18 Nov 2021 09:39:22 +0000</pubDate>
				<guid isPermaLink="false">/?post_type=ensayos&#038;p=4095</guid>

					<description><![CDATA[<p>Test methods Determining the thickness depending on the type of sheath can be performed under a microscope, a profile projector, a digital optical analyser or a ballpoint micrometer. All the materials from the inside and outside of the sheath may be removed if this is necessary to measure the thickness, although the integrity of the [&#8230;]</p>
<p>La entrada <a href="https://www.ceislab.com/en/ensayos/measurement-of-thickness-of-non-metallic-sheath-une-en-60811-202/">Measurement of thickness of non-metallic sheath: UNE-EN 60811-202</a> se publicó primero en <a href="https://www.ceislab.com/en">CEISLAB</a>.</p>
]]></description>
										<content:encoded><![CDATA[
<p class="wp-block-paragraph"><strong>Test methods</strong><strong></strong></p>



<p class="wp-block-paragraph">Determining the thickness depending on the type of sheath can be performed under a microscope, a profile projector, a digital optical analyser or a ballpoint micrometer.</p>



<p class="wp-block-paragraph">All the materials from the inside and outside of the sheath may be removed if this is necessary to measure the thickness, although the integrity of the sheath must be respected.</p>



<p class="wp-block-paragraph">Measurements are made radially on a thin strip of the material.</p>
<p>La entrada <a href="https://www.ceislab.com/en/ensayos/measurement-of-thickness-of-non-metallic-sheath-une-en-60811-202/">Measurement of thickness of non-metallic sheath: UNE-EN 60811-202</a> se publicó primero en <a href="https://www.ceislab.com/en">CEISLAB</a>.</p>
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